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Your search returned 17 records. Click on the hyperlinks to view further details of Titles.. |
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Magazine Name : Ieee Transactions On Electron Devices
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Year : 2004 Volume number : 51 Issue: 08 |
Thermal Resistance Of Metamorphic Inp-Based Hbtson Gaas Substrates Using A Linearly Graded In Ga-P Metamorphic Buffer
(Article)
Subject:
Heterojunctions
,
Bipolar Transistor
Author:
H
Yang
Hong
Wang
page:
1221
-
1227
Design Optimization Of Aiinas-Gainas Hemts For Low-Noise Applications
(Article)
Subject:
High-Electron Mobility
,
High-Speed
Author:
Javier
Mateos
Tomas
Gonzalez
page:
1228
-
1233
A Robust All-Wet-Etching Process For Mesa Formation Of Ingaas-Inp Hbt Featuring High Uniformity And High Reproducibility
(Article)
Subject:
Heterojunction Bipolar Transistor (Hbt)
,
High-Speed Electronic
Author:
Masaki
Yanagisawa
Koji
Kotani
page:
1234
-
1240
The Effect Of The Discharge Aging Process On The Surface State Of Mgo Film In Ac Pdps
(Article)
Subject:
Mgo
,
Plasma Display Panel
,
Superficial Layer
Author:
Kyung Cheol
Choi
Hee-Joong.
Kim
page:
1241
-
1244
Study Of Single - And Dual -Channel Designs For High-Performance Strained-Si-Sige N-Mosfets
(Article)
Subject:
Dual-Channel
,
Oxide Interface
Author:
Sarah H.
Olsen
G.O
Neill
page:
1245
-
1253
Electrical Analysis Of Mechanical Stress Induced By Sti In Short Mosfets Using Externally Applied Stress
(Article)
Subject:
Doping
,
External Mechanical Stress
Author:
G.
Reimbold
C.
Gallon
page:
1254
-
1261
Pocket Implanatation Effect On Drain Current Flicker Noise In Analog Nmosfet Devices
(Article)
Subject:
Flicker Phase Noise
,
Modeling
,
Nonuniform Threshold Voltage
Author:
Jun-Wei
Wu
Chih-Chang
Cheng
page:
1262
-
1266
Hole Traps In Silicon Dioxides-Part I: Properties
(Article)
Subject:
Anomalous
,
Border Traps
,
Breakdown Process
Author:
Jian F.
Zhang
Ce Z.
Zhao
page:
1267
-
1273
Hole-Traps In Silicon Dioxides-Part Ii: Generation Mechanism
(Article)
Subject:
Anomalous
,
Border Traps
Author:
C.
Zhao
F
Zhang
page:
1274
-
1280
Impact Of Correlated Generation Of Oxide Defects On Silc And Breakdown Distributions
(Article)
Subject:
Dielectric Breakdown
,
Flash Memories
Author:
Daniele
Ielmini
page:
1281
-
1287
Defect Generation Statistics In Thin Gate Oxides
(Article)
Subject:
Defect Generation
,
Flash Memories
Author:
Daniele
Ielmini
A.
Spinakis
page:
1288
-
1295
Comparartive Study Of Drift Region Designs In Rf Ldmosfets
(Article)
Subject:
Hot-Carrier
,
Lda
Author:
Guangjun
Cao
page:
1296
-
1303
Characteristics Of High-K Spacer Offset-Gated Polysilicon Tfts
(Article)
Subject:
High-K Dielectric Spacer
,
Self-Aligning Bearing
Author:
Z
Xiong
Haijun
Liu
page:
1304
-
1308
Average Drift Mobilty And Apparent Sheet-Electron Density Profiles In Strained-Si-Sige Buried-Channel Depletion-Mode N-Mosfets
(Article)
Subject:
Drift Mobility
,
Heterostructure
,
Metal-Oxide Semiconductor
Author:
Kostis
Michelakis
Antonio
Vilches
page:
1309
-
1314
Low-Frequency Noise In Submicrometer Mosfets With Hfo2, Hfo2/Al2o3 And Hfaio Gate Stacks
(Article)
Subject:
Flicker
,
Hafnium Aluminium
Author:
B. D
Min
Siva Prasad
Devireddy
page:
1315
-
1321
Gate-Drain Charge Analysis For Switching In Power Trench Mosfets
(Article)
Subject:
Dc-Dc Power Conversion
,
Gate-Drain Charge
Author:
Raymond J.E.
Hueting
Erwin A.
Hijzen
page:
1323
-
1330
Moving Current Filaments In Integrated Dmos Transistors Under Short-Duration Current Stress
(Article)
Subject:
Bcd
,
Current - Mode
Author:
Marie
Dension
Matej
Blaho
page:
1331
-
1339
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